Reliable docking for semiconductor testing

Our Docking Plates are adapted to all common Handler and Prober Systems. Integration with our P-Dock^Ⓡ and F-Dock Systems is possible, as are individually developed systems for your requirements.

Product overview

X / Y Shift for Horizontal and Vertical IC Handlers

Universal Docking Plates work for any Testhead size. Our plates fit all Standard Tester Docking Systems (e.g. Teradyne, Advantest etc.) as well as the P-Dock® pin arrangements S, M and L.

Precise X / Y - adjustment in any rest position with an accuracy of 0.01 mm and seamless installation make our Docking Plates the ideal candidate for high-volume production.

Docking with adjustable Z-Stack

Easy-to-use for multiple Z-Stack applications, this is a competitive advantage for our customers – for measurable increases in yield performance of up to 2%. UDXL Plates can be used universally in ATE Test, with or without the P-Dock^Ⓡ System.

Product overview of Docking Plates

All Docking Plates X/Y Shift Z-Stack

X/Y shift

Docking Plate
X / Y Shift Horizontal Handler

The X / Y Shift Plate for Horizontal Handlers has fine adjustable locking positions with an accuracy of 0.01 mm. Because of the exchangeable module plate, this docking can be used for all common Docking Systems.

X/Y shift

Universal Docking Plate
UDXL X / Y Shift for Vertical Handler

The Universal Docking Plate UDXL X / Y Shift is based on our standard UDXL. It can move to certain stop positions in the X / Y level as quickly as possible.